Technological evolution of long pulse width component IV tester

　　Technological Evolution and Industrialization Practice of Long Pulse Width Component IV Tester

　　1、 Innovation in core technology of equipment

　　1. Millisecond level steady-state optical pulse system

　　The long pulse width component IV tester adopts a specially designed xenon lamp power management system, which can achieve adjustable pulse width output of 10-200ms and uneven light intensity of<2%. Compared to traditional<10ms flash testing, its long-term steady-state characteristics are closer to outdoor real power generation environments, making it particularly suitable for accurate measurement of 182/210mm large-sized components.

　　2. Dynamic load matching technology

　　Through adaptive electronic load design, the device can automatically adjust the scanning rate (0.1-10ms/point) and maintain a measurement accuracy of ± 0.5% within the 600V/15A testing range. Comparative experiments show that when testing double glass double-sided components, the power measured by the long pulse width component IV tester is 1.2-1.8% higher than that of conventional equipment.

　　3. Three dimensional temperature field compensation

　　Integrated 16 channel infrared temperature measurement system, real-time monitoring of component surface temperature distribution. Combining AI algorithms to correct the temperature coefficient of the IV curve, reducing the power measurement uncertainty under STC conditions to within ± 0.8%.

　　2、 Typical application scenarios

　　1. Double sided component evaluation

　　The long pulse width component IV tester is equipped with a double-sided synchronous lighting system, which can simulate different ground reflectivity (10% -70%). Its unique Bifi coefficient testing mode can accurately quantify the impact of backside gain on component performance.

　　2. Weak light performance analysis

　　By adjusting the light intensity to 200-1000W/m ², the device can draw a complete low irradiance characteristic curve. The application shows that this function helps detect abnormal power dips in PID attenuation components under low light conditions.

　　3. Hot spot durability test

　　According to the requirements of IEC 61215 standard, the equipment can perform a continuous hot spot test for up to 30 minutes and automatically record key parameters such as maximum reverse bias voltage.

　　3、 Industry application value

　　Against the backdrop of photovoltaic module power entering the 700W+era, the long pulse width module IV tester exhibits unique advantages:

　　1. Process optimization: By analyzing the changes in the filling factor of the IV curve, a certain enterprise successfully reduced the welding defect rate from 1.2% to 0.3%

　　2. Quality traceability: Each component generates an electronic file containing 54 electrical parameters

　　3. Standard compliance: meets the requirements of IEC 61853-1 full matrix testing

　　With the development of perovskite stacked modules, the new generation of long pulse width module IV tester supporting multi junction cell testing has entered the validation stage. Its linkage system with EL detection and appearance detection is reconstructing the quality control system of the entire photovoltaic module process.