Product Name


Perovskite Solar Cell EL+PL Tester(YHG‑ELPL)

Introduction


The YHG‑ELPL is a high‑precision integrated EL+PL inspection system developed by Yohasolar Laser for perovskite cells. It combines Electroluminescence (EL) and Photoluminescence (PL) imaging to rapidly and non‑destructively identify internal and material‑intrinsic defects. Widely used in academic research, industrial R&D, pilot lines and mass production QC.

Applications

  • Single‑junction perovskite cells
  • Flexible perovskite cells
  • Silicon‑perovskite tandem cells
  • Custom sizes available

Key Advantages

  • Dual‑mode integration: EL/PL one‑click switch, synchronized imaging
  • High precision: Sensitivity ≥50μm, resolution ≥0.1mm/pixel
  • Full defect coverage: Scratches, cracks, black areas, grain boundaries, inhomogeneity
  • High speed: Cycle time ≤1s, production‑line friendly
  • R&D & production ready: Material analysis, process optimization, grading & traceability

Technical Highlights

  • EL: 0–120V/0–2A programmable power, multi‑protection, stable imaging
  • PL: 450/915/980nm optional laser, 25W adjustable, uniformity ≥90%
  • Cameras: Telephoto + wide‑field dual cameras, from small samples to large panels
  • Software: Auto defect detection, thermal map, grayscale analysis, data traceability
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Typical Use Cases


University lab defect analysis|R&D process iteration|Pilot line yield improvement|Mass production 100% inspection, grading & traceability